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Boundary scan
Results: 183

#	Item
141	Breakthrough silicon scanning discovers backdoor in military chip (DRAFT of 05 March[removed]Sergei Skorobogatov Christopher Woods Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2012-05-28 09:08:30 Electronics manufacturing Manufacturing IEEE standards Microcontrollers Joint Test Action Group Power analysis Boundary scan Field-programmable gate array TI MSP430 Electronics Electronic engineering Embedded systems
142	Change-tracking markup shows ALey edits as of 26 Apr 2006: = note that my edits are based on and made to accommodate the primary assumption that the scope of section 13 and the purpose of section 14 should be incorporat Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:20:18 Technology Boundary scan description language Boundary scan Joint Test Action Group Digital electronics Institute of Electrical and Electronics Engineers Design for testing Serial Vector Format Electronics manufacturing Electronic engineering Electronics
143	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for February 22nd, 2005 9:00AM-11:00AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-05-15 15:47:48 Boundary scan Joint Test Action Group Information Processing Language Cell Battery Electronics manufacturing Electronics Technology
144	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 20th, 2005 8:00AM-9:45AM Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 17:20:20 Technology Boundary scan Joint Test Action Group Cell Electronics manufacturing Manufacturing Electronics
145	Implementing and Using a Mixed-Signal Test Bus Stephen Sunter [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2004-11-27 10:19:57 Manufacturing Electronic design Integrated circuits Embedded systems Joint Test Action Group Boundary scan Digital electronics IC power supply pin Integrated circuit design Electronic engineering Electronics Electronics manufacturing
146	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for September 25th, [removed]:00 – 1:00 PM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-09-29 08:00:46 Software Cron Bracket Joint Test Action Group Minutes Boundary scan C Computing Electronics manufacturing Electronics
147	Breakthrough silicon scanning discovers backdoor in military chip Sergei Skorobogatov1 and Christopher Woods2 1 University of Cambridge, Computer Laboratory, Cambridge, UK Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2012-09-13 11:41:35 Electronics manufacturing Manufacturing Digital electronics Microcontrollers Joint Test Action Group Field-programmable gate array Boundary scan TI MSP430 Actel Electronic engineering Electronics Embedded systems
148	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for October 3rd, 2008 8:00 – 9:00 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-10-06 12:58:03 IEEE standards Technology Joint Test Action Group Standards organizations Cron Differential Institute of Electrical and Electronics Engineers Attribute grammar Boundary scan description language Computing Electronics manufacturing Electronics
149	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for May 22nd, 2007 7:30 AM – 8:30 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-06-12 11:15:11 Boundary scan description language Joint Test Action Group Electromagnetism Boundary scan Attribute Electronics manufacturing Electronics Technology
150	IEEE[removed]Mixed-Signal Test Bus Working Group Meeting Minutes for April 24th , 2007 7:30 AM – 8:40 AM PDT Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-05-01 10:56:38 Electronic engineering Boundary scan description language Boundary scan Joint Test Action Group Minutes Cron Electronics manufacturing Electronics Technology

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